Well, I actually did watch the whole testing process very closely and can confirm that 28nm figure to be empirically derived

(I hope my word still has some value on these forums)
Empirically derived? What on earth does that mean in the real world of engineering?
If you were an engineer at CERN working with subatomic particles with ultra short lifetimes I might understand using this expression, but in our macro world we have voltmeters, ammeters and oscilloscopes that negate the need for 'derivation'.
Are you trying to say that that put some figures into a simulator and uses some trial and error to get the result you want? Naturally, you are not answerable to anyone on this forum or indeed any paying customers, so whatever you claim doesn't need to be defended in any way.
What I'm saying is we have tested and profiled the 28nm chips extensively and this figure is a real world measured figure, not based on simulation. Hence the wording.